X-ray diffraction (XRD) is a versatile, non-destructive technique for material characterisation. It is used to determine phase composition (i.e. mineral, chemical and crystalline compounds), structure, texture, etc of powdered or solid samples.
XRD is generally the fastest and most reliable method for identification and quantification of crystalline materials. Just about any sample type can be analysed to give a diffraction pattern that can then be used to identify and/or quantify phases present.
Common applications for XRD include analysis of:
Sietronics offer a range of XRD related services:
Qualitative XRD Analysis
Identification of minerals, phases and chemical compounds in a variety of geological, chemical and industrial materials with estimate of abundance based on relative peak heights in diffraction pattern.
Abundance estimates: Major (>30%), Minor (30% - 10%) and Trace (10% - detection limit).
Example Qualitative Report
Quantitative XRD Analysis
Minerals, phases and chemical compounds are quantified using SIROQUANTTM, a Rietveld based multiphase analysis program, which uses least squares regression to obtain quantitative data for mineralogical samples.
Example Quantitative XRD Report
Clay Mineralogy XRD Analysis
Clay minerals are identified and speciated through bulk sample XRD, Clay Separation (<2 micron fraction), XRD of oriented clay mounts and an array of pre-treatments (glycolation, heat treatments 350°C and 550°C).
Example Clay Mineralogy Report