Home  //  Lab Services  //  XRF

XRF Testing and Analysis

XRF ElementsXRF is an analytical technique routinely used for chemical analysis of a wide variety of materials. It is a fast, accurate and non-destructive method for analysis of a large range of material types from solids and liquids to filtered material and powders.

XRF is used in a wide variety of applications within the mining, environmental, industrial and pharmaceutical industries from analysis of core, soil and water through to cement, alloy metals and drugs.

Chemical data obtained from XRF is both precise and reproducible using either calibrations made from good reference standards or even in “standardless” calibrations. 

In general, XRF allows quantification of elements, Fluorine (Z= 9) through to Uranium (Z= 92) in concentrations ranging from parts per million (ppm) to percent (%).

 

Sietronics offer X-ray Fluorescence (XRF) related services:

Major Element Analysis
Sample is generally fused and analysed for major elements. Results in oxide weight %

Trace Element Analysis
Sample is prepared as a pressed pellet and analysed for Trace elements. Results in parts per million (ppm)

Loss on Ignition (LOI)
Sample is thermo gravimetrically analysed to determine amount of moisture or impurities lost when heated to 1000°C.

Screening Analysis
Samples are screened for elements of interest using a portable XRF analyser. Rapidly screen hundreds of sample to obtain indicative concentrations of elements to allow fast decision making. Very useful for identifying samples with increased exploration potential.

Diffraction Pattern

X-RAY DIFFRACTION (XRD)

Identification and Quantification (Wt%) of minerals, phases and crystalline compounds in a wide variety of geological, chemical and industrial materials.
Clay ID

Clay Analysis

Determination of clay mineralogy and speciation of clay minerals
 
Periodic Table

X-RAY FLUORESCENCE (XRF)

Major and trace element analysis, Loss on Ignition (LOI).



Petrography

Other Techniques

Particle Size Analysis, Scanning Electron, Microscopy (SEM), Petrography.

.